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Jarmusik, K.E., Eppell, S.J., Lacks, D.J. and Zypman, F.R. (2011) Obtaining Charge Distributions on Geometrically Generic Nanostructures Using Scanning Force Microscopy. Langmuir, 27, 1803-1810.
http://dx.doi.org/10.1021/la104153p

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