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Lazzaria, R., Jupillea, J. and Borenszteinb, Y. (1999) In Situ Study of a Thin Metal Film by Optical Means. Applied Surface Science, 142, 451-454.
http://dx.doi.org/10.1016/s0169-4332(98)00646-1

has been cited by the following article:

• TITLE: The Effect of Nanometer Size Effect on the Optical Property of Metallic Wire Grid

  AUTHORS: Yulun Wu, Shimeng Feng

  KEYWORDS: Metallic Wire Grid, Mean Free Path, Reflectivity

  JOURNAL NAME: Optics and Photonics Journal, Vol.6 No.10, October 27, 2016

  ABSTRACT: We mainly investigated the effect of metallic wire grid on its optical property. At first, we give one simple model to deduce an expression which can describe the relationship of the optical property with the width of metallic wire grid. This expression could be used to calculate the reflectance of the metallic wire grid. We also give the corresponding computer simulation. Our simulation shows that the reflectance would increase when the width of metallic wire grid increase. The wider the metallic wire grid is, the higher the reflectance is. The reflectance would reach the maximum value only when the width is over the free path of electronic.