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Zhang, L., Sakai, T., Sakuma, N., Ono, T. and Nakayama, K. (1999) Nanostructural Conductivity and Surface-Potential Study of Low-Field-Emission Carbon Films with Conductive Scanning Probe Microscopy. Applied Physics Letters, 75, 3527-3529.
http://dx.doi.org/10.1063/1.125377

has been cited by the following article:

• TITLE: Surface Properties of Cement Paste Evaluated by Scanning Probe Microscopy

  AUTHORS: Yuya Sakai

  KEYWORDS: Cement Paste, Scanning Probe Microscopy, Surface Potential, Frictional Resistance, Viscoelasticity

  JOURNAL NAME: Open Journal of Civil Engineering, Vol.6 No.4, September 29, 2016

  ABSTRACT: The microscopic physical properties of Hardened Cement Paste (HCP) surfaces were evaluated by using Scanning Probe Microscopy (SPM). The cement pastes were cured under a hydrostatic pressure of 400 MPa and the contacting surfaces with a slide glass during the curing were studied. Scanning Electron Microscope (SEM) observation at a magnification of 7000 revealed smooth surfaces with no holes. The surface roughness calculated from the SPM measurement was 4 nm. The surface potential and the frictional force measured by SPM were uniform throughout the measured area 24 h after the curing. However, spots of low surface potential and stains of low frictional force and low viscoelasticity were observed one month after curing. This change was attributed to the carbonation of hydrates.