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Tanner, B.K., Wittge, J., Vagovic, P., Baumbach, T., Allen, D., McNally, P.J., Bytheway, R., Jacques, D., Fossati, M.C., Bowen, D.K., Garagorri, J., Elizalde, M.R. and Danilewsky, A.N. (2013) X-Ray Diffraction Imaging for Predictive Metrology of Crack Propagation in 450-mm Diameter Silicon Wafers. Powder Diffraction, 28, 95-99.
http://dx.doi.org/10.1017/S0885715613000122

has been cited by the following article:

• TITLE: Planar Retro-Reflector for Grazing Incident Beam of High-Energy X-Ray Photons

  AUTHORS: Hakob Jacob Bezirganyan, Robert Bezirganyan, Siranush Bezirganyan

  KEYWORDS: X-Ray, Diffraction Theory, Single-Crystal, Total Retro-Reflection, Mathieu Functions

  JOURNAL NAME: Journal of Applied Mathematics and Physics, Vol.4 No.9, September 27, 2016

  ABSTRACT: The grazing-incidence hard X-ray retro-reflector (GIRR) is a novel optical element, which completely suppresses the conventional mirror beam in the retro-reflection mode, and, at the same time, totally reflects the primary grazing incident X-radiation backwards to its source in strictly anti-parallel direction with minimal scattering. The GIRR is a good alternative to hard X-ray normal-incidence Bragg mirror, and has a high potential for applications in various X-ray optical devices and techniques, such as, hard X-ray optical noise (or background) filters, high-quality hard X-ray waveguides, low-gain hard X-ray free electron laser resonators (XFELRs), X-ray holography, coherent X-ray diffraction imaging, phase-contrast imaging, as well as in hard X-ray optical data storage devices and deep space hard X-ray communications. The proposed optical element consists of single-crystal wafer covered by a thin, non-diffracting layer of low-absorbing material.