Article citationsMore>>

Ferroglio, L., Mana, G. and Massa, E. (2008) Si Lattice Parameter Measurement by Centimeter X-Ray Interferometry. Optics Express, 16, 16877-16888.
http://dx.doi.org/10.1364/OE.16.016877

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top