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Sutter, J.P., Alp, E.E., Hu, M.Y., Lee, P.L., Sinn, H., Sturhahn, W. and Toellner, T.S. (2001) Multiple-Beam X-Ray Diffraction Near Exact Backscattering in Silicon. Physical Review B, 63, Article ID: 094111.
http://dx.doi.org/10.1103/physrevb.63.094111

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