Article citationsMore>>

Henderson, R. (2013) Avoiding the Pitfalls of Single Particle Cryo-Electron Microscopy: Einstein from Noise. Proceedings of the National Academy of Sciences of the United States of America, 110, 18037-18041.
http://dx.doi.org/10.1073/pnas.1314449110

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top