Article citationsMore>>

M. Blanco, P. Gutiérrez and G. Satriani, “SPI Patterns: Learning from Experience,” IEEE Software, Vol. 18, No. 3, 2001, pp. 28-35. doi:10.1109/52.922722

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top