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Dupont, L., Zoubir, K., Lefebvre, S. and Bontemps, S. (2006) Effects of Metallization Thickness of Ceramic Substrates on the Reliability of Power Assemblies under High Temperature Cycling. Microelectronics Reliability, 46, 1766-1771.
http://dx.doi.org/10.1016/j.microrel.2006.07.057

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