Article citationsMore>>

Lefranc, G., Licht, T., Schults, H.J., Beinert, R. and Mitic, G. (2000) Reliability Testing of High Power Multi-Chip IGBT Modules. Microelectronics Reliability, 40, 1659-1663.
http://dx.doi.org/10.1016/S0026-2714(00)00185-2

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top