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Benmansour, A., Azzopardi, S., Martin, J.-C. and Woirgard, E. (2006) Failure Mechanism of Trench IGBT under Short-Circuit after Turn-Off. Microelectronics and Reliability, 46, 1778-1783.
http://dx.doi.org/10.1016/j.microrel.2006.07.059

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