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Shiozaki, Y., Nakamura, E., Mitsui, T., et al. (2002) Ferroelectrics and Related Substances, Landolt-Bornstein New Series III-39, Subvolume A2: Oxides. Springer-Verlag, Berlin, 245. Nakamura, E., Mitsui, T., Adachi, M., Akishige, Y., Deguchi, K., Harada, J., Ikeda, T., Okuyama, M., Sawaguchi, E., Shiozaki, Y., Toyoda, K., Yamada, T., Gesi, K., Hikita, T., Makita, Y., Shigenari, T., Tatsuzaki, I. and Yagi, T. (1990) Ferroelectrics and Related Substances, Landolt-Bornstein New Series III-28, Subvolume A: Oxides. Springer-Verlag, Berlin, 173.

has been cited by the following article:

• TITLE: Ferroelectricity in Layered Perovskites as a Model of Ultra-Thin Films

  AUTHORS: Masanori Fukunaga, Masaki Takesada, Akira Onodera

  KEYWORDS: Ferroelectricity, Layered Oxide, Perovskite, Thin Film, Size Effect

  JOURNAL NAME: World Journal of Condensed Matter Physics, Vol.6 No.3, August 12, 2016

  ABSTRACT: The instability of thin ferroelectric films is discussed based on the close similarity of dielectric properties between bulk Bi-layered perovskites and thin BaTiO3 films. The dielectric properties of pseudo-two-dimensional layered perovskites suggest that the bulk layered ferroelectric is a good model of ultra-thin ferroelectric film with a few perovskite units, free from any misfit lattice strain. It seems plausible that the ferroelectric interaction is still prominent but shows a crossover from ferroelectric to antiferroelectric along the unique c-axis (perpendicular to the film plane); with decreasing thickness, the ferroelectricity appears within the plane, which results in so-called “canted ferroelectricity”. An extra relaxation mode induced by surface effect of thin films correlates with soft mode, which results in a new intermediate phase between the paraelectric and ferroelectric phases. These evidences may indicate no critical thickness even for ferroelectric ultra- thin films.