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Haeni, J.H., Theis, C.D., Schlom, D.G., Tian, W., Pan, X.Q., Cheng, H., Takeuchi, I. and Xiang, X.D. (2001) Epitaxial Growth of the First Five Members of the Srn+1 Tin O3n+1 Ruddlesden-Popper Homologous Series. Applied Physics Letters, 78, 3292-3294.
http://dx.doi.org/10.1063/1.1371788

has been cited by the following article:

• TITLE: Ferroelectricity in Layered Perovskites as a Model of Ultra-Thin Films

  AUTHORS: Masanori Fukunaga, Masaki Takesada, Akira Onodera

  KEYWORDS: Ferroelectricity, Layered Oxide, Perovskite, Thin Film, Size Effect

  JOURNAL NAME: World Journal of Condensed Matter Physics, Vol.6 No.3, August 12, 2016

  ABSTRACT: The instability of thin ferroelectric films is discussed based on the close similarity of dielectric properties between bulk Bi-layered perovskites and thin BaTiO3 films. The dielectric properties of pseudo-two-dimensional layered perovskites suggest that the bulk layered ferroelectric is a good model of ultra-thin ferroelectric film with a few perovskite units, free from any misfit lattice strain. It seems plausible that the ferroelectric interaction is still prominent but shows a crossover from ferroelectric to antiferroelectric along the unique c-axis (perpendicular to the film plane); with decreasing thickness, the ferroelectricity appears within the plane, which results in so-called “canted ferroelectricity”. An extra relaxation mode induced by surface effect of thin films correlates with soft mode, which results in a new intermediate phase between the paraelectric and ferroelectric phases. These evidences may indicate no critical thickness even for ferroelectric ultra- thin films.