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Pan, T.-M. and Yen, L.-C. (2010) Influence of Postdeposition Annealing on Structural Properties and Electrical Characteristics of Thin Tm2O3 and Tm2Ti2O7 Dielectrics. Applied Surface Science, 256, 2786-2791.
http://dx.doi.org/10.1016/j.apsusc.2009.11.029

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