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Boulouz, A., Giani, A., Pascal-Delannoy, F., Boulouz, M., Foucaran, A. and Boyer, A. (1998) Preparation and Characterization of MOCVD Bismuth Telluride Thin Films. Journal of Crystal Growth, 194, 336-341. http://dx.doi.org/10.1016/S0022-0248(98)00690-3

has been cited by the following article:

• TITLE: Studying Thermoelectric Power Behaviors of Bi2Te3 Nanoparticles Prepared by Thermal Evaporation

  AUTHORS: Sayed Mohammad Elahi, Hana Nazari, Laya Dejam, Hamid Reza Gorji

  KEYWORDS: Bismuth Telluride, Thermoelectric Power, Thermal Evaporation, Thermal Annealing

  JOURNAL NAME: Open Journal of Applied Sciences, Vol.6 No.6, June 16, 2016

  ABSTRACT: Thin films of Bismuth Telluride (Bi2Te3) are prepared by thermal evaporation from nanopowders on the glass substrates. The XRD patterns of films show that all the films are polycrystalline and the crystalline increased by annealing temperature. Measuring of the thermoelectric power of thin films in the temperature range 300 to 380 K shows that Seebeck Coefficients have both negative and positive values, indicating that the films have both n-type and p-type conductivity. The re-crystallization of films is done by annealing from 130°C to 175°C and Seebeck Coefficient varied from -150 to 100 μV/K.