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Krishnan, R., Xie, Q., Kulik, J., Wang, X.D., Lu, S., Gao, Y., Krauss, T.D., Fauchet, P.M. (2004) Effect of Oxidation on Charge Localization and Transport in a Single Layer of Silicon Nanocrystals. Journal of Applied Physics, 96, 654.
http://dx.doi.org/10.1063/1.1751632

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