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Krishnan, D., Tay, T. and Fergus, R. (2011) Blind Deconvolution Using a Normalized Sparsity Measure. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Providence, 20-25 June 2011, 233-240.
http://dx.doi.org/10.1109/cvpr.2011.5995521

has been cited by the following article:

• TITLE: Topography Measurement for Monitoring Manufacturing Processes in Harsh Conditions

  AUTHORS: Thomas Mueller, Andreas Poesch, Eduard Reithmeier

  KEYWORDS: Optical Inspection, Topography Measurement, Laser Triangulation, Precision Manufacturing

  JOURNAL NAME: Engineering, Vol.8 No.5, May 23, 2016

  ABSTRACT: High precision manufacturing, e.g. milling and grinding, which have manufacturing tolerances in the range of