Article citationsMore>>

Kundur, D. and Hatzinakos, D. (1996) Blind Image Deconvolution. IEEE Signal Processing Magazine, 13, 43-64.
http://dx.doi.org/10.1109/79.489268

has been cited by the following article:

• TITLE: Topography Measurement for Monitoring Manufacturing Processes in Harsh Conditions

  AUTHORS: Thomas Mueller, Andreas Poesch, Eduard Reithmeier

  KEYWORDS: Optical Inspection, Topography Measurement, Laser Triangulation, Precision Manufacturing

  JOURNAL NAME: Engineering, Vol.8 No.5, May 23, 2016

  ABSTRACT: High precision manufacturing, e.g. milling and grinding, which have manufacturing tolerances in the range of