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Levin, A., Weiss, Y., Durand, F. and Freeman, W.T. (2009) Understanding and Evaluating Blind Deconvolution Algorithms. IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops), Miami, 20-25 June 2009, 1964-1971.

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• TITLE: Topography Measurement for Monitoring Manufacturing Processes in Harsh Conditions

  AUTHORS: Thomas Mueller, Andreas Poesch, Eduard Reithmeier

  KEYWORDS: Optical Inspection, Topography Measurement, Laser Triangulation, Precision Manufacturing

  JOURNAL NAME: Engineering, Vol.8 No.5, May 23, 2016

  ABSTRACT: High precision manufacturing, e.g. milling and grinding, which have manufacturing tolerances in the range of