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Mueller, T., Poesch, A. and Reithmeier, E. (2015) Measurement Uncertainty of Microscopic Laser Triangulation on Technical Surfaces. Microscopy and Microanalysis, 21, 1443-1454.
http://dx.doi.org/10.1017/S1431927615015330

has been cited by the following article:

• TITLE: Topography Measurement for Monitoring Manufacturing Processes in Harsh Conditions

  AUTHORS: Thomas Mueller, Andreas Poesch, Eduard Reithmeier

  KEYWORDS: Optical Inspection, Topography Measurement, Laser Triangulation, Precision Manufacturing

  JOURNAL NAME: Engineering, Vol.8 No.5, May 23, 2016

  ABSTRACT: High precision manufacturing, e.g. milling and grinding, which have manufacturing tolerances in the range of