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van der Bijl, R.-J.M., Fähnle, O.W., van Brug, H. and Braat, J.J.M. (2000) Inprocess Monitoring of Grinding and Polishing of Optical Surfaces. Applied Optics, 39, 3300.
http://dx.doi.org/10.1364/AO.39.003300

has been cited by the following article:

• TITLE: Topography Measurement for Monitoring Manufacturing Processes in Harsh Conditions

  AUTHORS: Thomas Mueller, Andreas Poesch, Eduard Reithmeier

  KEYWORDS: Optical Inspection, Topography Measurement, Laser Triangulation, Precision Manufacturing

  JOURNAL NAME: Engineering, Vol.8 No.5, May 23, 2016

  ABSTRACT: High precision manufacturing, e.g. milling and grinding, which have manufacturing tolerances in the range of