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Zhu, J.S., Qin, H.X., Bao, Z.H., Wang, Y.N., Cai, W.Y., Chen, P.P., Lu, W., Chan, H.L.W. and Choy, C.L. (2001) X-Ray Diffraction and Raman Scattering Study of SrBi2Ta2O9 Ceramics and Thin Films with Bi3TiNbO9 Addition. Applied Physics Letters, 79, 3827-3829.

has been cited by the following article:

• TITLE: Synthesis, Structural and Dielectric Properties of SrBi1.8Ce0.2Ta2O9

  AUTHORS: Mohamed Afqir, Amina Tachafine, Didier Fasquelle, Mohamed Elaatmani, Jean-Claude Carru, Abdelouahad Zegzouti, Mohamed Daoud

  KEYWORDS: Aurivillius, Solid-State, Electron Microscopy, Raman, Dielectric Properties, Electrical Conductivity

  JOURNAL NAME: Open Journal of Physical Chemistry, Vol.6 No.2, May 20, 2016

  ABSTRACT: This Ce-doped strontium bismuth tantalate SrBi1.8Ce0.2Ta2O9 was prepared by solid-state reaction. X-ray diffraction was used to determine the crystal structure of the powders. The Raman spectrum of SrBi1.8Ce0.2Ta2O9 sample was measured to confirm X-ray diffraction result. The microstructure of ceramic was observed by Scanning Electron Microscope (SEM). The Temperature dependence of the dielectric properties of ceramic was investigated from the room temperature to 400°C.