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Parfitt, M., Vickerman, J.C., Mitchell, R., Carr, C.M., Ince, N. and Knight, P. (2003) Surface Analysis of Softened Paper by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and the Kawabata Evaluation System. Journal of Materials Science, 38, 2171-2177.
http://dx.doi.org/10.1023/A:1023728114543
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