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Menchaca, C., Nava, J.C., Valdéz, S., Sarmiento-Martínez, O. and Uruchurtu, J. (2010) Gamma-Irradiated Nylon Roughness as Function of Dose and Time by the Hurst and Fractal Dimension Analysis. Journal of Materials Science and Engineering, 4, 50-58.

has been cited by the following article:

• TITLE: Recurrence Quantification Analysis of Rough Surfaces Applied to Optical and Speckle Profiles

  AUTHORS: Oscar Sarmiento Martinez, Darwin Mayorga Cruz, Jorge Uruchurtu Chavarín, Estela Sarmiento Bustos

  KEYWORDS: RQA, Recurrence Plots, Roughness, Optical Data Processing, Speckle Patterns

  JOURNAL NAME: Journal of Applied Mathematics and Physics, Vol.4 No.4, April 27, 2016

  ABSTRACT: In this paper, Recurrence Quantification Analysis (RQA) is set as a practical nonlinear data tool to establish and compare surface roughness (Ra) through percentage parameters of a dynamical system: Recurrence (%REC), Determinism (%DET) and Laminarity (%LAM). Variations in surface roughness of different machining procedures from a typical metallic casting comparator are obtained from scattering intensity of a laser beam and expressed as changes in the statistics of speckle patterns and profiles optical properties. The application of the analysis (RQA) by Recurrence Plots (RPs), allowed to distinguish between machining procedures, highlighting features that other methods are unable to detect.