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Gong, J., Dai, R., Wang, Z. and Zhang, Z. (2015) Thickness Dispersion of Surface Plasmon of Ag Nano-Thin Films: Determination by Ellipsometry Iterated with Transmittance Method. Scientific Reports, 5, Article Number: 9279.
http://dx.doi.org/10.1038/srep09279

has been cited by the following article:

• TITLE: Characterization of Nanorod Structure Using Spectroscopic Ellipsometry

  AUTHORS: N. E. J. Omaghali

  KEYWORDS: Spectroscopy, Ellipsometry, Nanorod, Resonance Modes

  JOURNAL NAME: Optics and Photonics Journal, Vol.6 No.4, April 21, 2016

  ABSTRACT: We investigate the resonance modes of gold nanorods on an Indium tin oxide (ITO) coated glass substrate using spectroscopic ellipsometry. The unit cell of the structure investigated is composed of two gold nanorods with differing lengths. In such a structure, we can excite the bright resoance and the dark resonance modes. Numerical simulation of the gold nanorod on substrate was performed with the bright resonance mode at 825.0 nm and the dark resonance mode at 1107.1 nm respectively. Using spectroscopic ellipsometry we optically characterize the fabricated gold nanostructure, with the bright resonance mode at 700.0 nm and the dark resonance mode at 1350.0 nm respectively. The experimental results from ellipsometry show a good agreement with the results from simulation.