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Paul, S., Chakraborty, R.S. and Bhunia, S. (2007) VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips. 25th IEEE VLSI Test Symposium (VTS’07), Berkeley, CA, 6-10 May 2007, 455–460.

has been cited by the following article:

• TITLE: Analysis of Recent Secure Scan Test Techniques

  AUTHORS: Cheng Xing, Sungju Park, Ji Zhao

  KEYWORDS: Side Channel Attack, Scan Test Techniques, Secure Scan Designs

  JOURNAL NAME: Journal of Software Engineering and Applications, Vol.9 No.3, March 31, 2016

  ABSTRACT: Side channel attack may result in user key leakage as scan test techniques are applied for crypto-graphic chips. Many secure scan designs have been proposed to protect the user key. This paper meticulously selects three current scan test techniques, analyses their advantages and disadvantages and also compares them in security and area overhead. Users can choose one of them according to the requirements and further combination can be implemented to achieve better performance.