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Lal, K. and Bhaghavannarayana, G. (1989) A High-Resolution Diffuse X-Ray Scattering Study of Defects in Dislocation-Free Silicon Crystals Grown by the Float-Zone Method and Comparison with Czochralski-Grown Crystals. Journal of Applied Crystallography, 22, 209.
http://dx.doi.org/10.1107/S0021889888014062

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