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J. R. Vazquez and J. P. de Gyvez, “Built-in Current Sensor for ?IDDQ Testing of Deep Submicron Digital CMOS ICs,” Proceeding of the 22nd IEEE VLSI Test Symposium, Napa Valley, 25-29 April 2004, pp. 53-58. doi:10.1109/VTEST.2004.1299225

has been cited by the following article:

• TITLE: ΔIDDQ Testing of a CMOS Digital-to-Analog Converter Considering Process Variation Effects

  AUTHORS: Rajiv Soundararajan, Ashok Srivastava, Siva Sankar Yellampalli

  KEYWORDS: IDDQ Testing, DAC, BICS, Sub-Micron CMOS IC, ΔIDDQ Testing, Process Variation, Background Current

  JOURNAL NAME: Circuits and Systems, Vol.2 No.3, July 6, 2011

  ABSTRACT: In this paper, we present the implementation of a built-in current sensor (BICS) which takes into account the increased background current of defect-free circuits and the effects of process variation on ΔIDDQ testing of CMOS data converters. A 12-bit digital-to-analog converter (DAC) is designed as the circuit under test (CUT). The BICS uses frequency as the output for fault detection in CUT. A fault is detected if it causes the output frequency to deviate more than ±10% from the reference frequency. The output frequencies of the BICS for various (MOSIS) model parameters are simulated to check for the effect of process variation on the frequency deviation. A set of eight faults simulating manufacturing defects in CMOS data converters are injected using fault-injection transistors and tested successfully.