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Q. Su, W. Lan, Y. Y. Wang and X. Q. Liu, “Structural Characterization of -V2O5 Films Prepared by DC Reactive Magnetron Sputtering,” Applied Surface Science, Vol. 255, 2009, pp. 4177-4179. doi:10.1016/j.apsusc.2008.11.002

has been cited by the following article:

• TITLE: Soft-Chemical Synthesis of Vanadium Oxide Nanostructures Using 3, 3’, 3”-Nitrilotripropionic Acid ( NTP) as a Carrier

  AUTHORS: V. S. Reddy Channu, Rudolf Holze, B. Rambabu

  KEYWORDS: Nanomaterials, Soft-Chemical Method, Morphology, Cyclic Voltammogram

  JOURNAL NAME: Soft Nanoscience Letters, Vol.1 No.3, July 20, 2011

  ABSTRACT: Vanadium oxide nanostructures were synthesized using NTP as a carrier through soft-chemical method. The influence of calcination temperature on the phase and morphology of obtained pristine product were characterized using X-ray diffraction (XRD), thermal gravimetric analysis (TGA) and scanning electron microscopy (SEM). Cyclic voltammogram studies were conducted to examine the electrochemical performance of cathodes made of vanadium oxide nanostructures. X-ray diffraction results show that, the particle size of the nanomaterials is increases with the increasing of calcination temperature.