TITLE:
Characterization of Silver Nanoparticles Thin Films with Various Thicknesses by AFM
AUTHORS:
Ling Li, Ling Li, Weidong Chen, Jie Zheng, Linwen Wang, Yan Chen
KEYWORDS:
Ag NPs Thin Films, Surface Morphology, AFM, SPR, Growth Nature
JOURNAL NAME:
Journal of Materials Science and Chemical Engineering,
Vol.4 No.1,
January
11,
2016
ABSTRACT: Ag nanoparticles (NPs) thin films with
various thicknesses were prepared by thermal evaporation method. Atomic force
microscopy (AFM) and UV-Vis spectrophotometer were used to study the surface
morphology, growth nature and optical properties of the films. The
results indicate that the growth rates of Ag particles in lateral and vertical
direction are variable, and the dominant growth rate of Ag particles in
lateral direction will convert into dominant growth rate in vertical direction as
films grow thicker. The mean value and distribution of Ag NPs height
related with the location and width of SPR (surface plasmonresonance) peak.
Higher mean height shifts SPR peak to longer wavelengths, and smaller deviation
results in narrower width of SPR peaks.