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Stoner, B.R., Ma, G.H.M., Wolter, S.D. and Glass, J.T. (1992) Characterization of Bias-Enhanced Nucleation of Diamond on Silicon by Invacuo Surface Analysis and Transmission Electron Microscopy. Physical Review B, 45, 11067- 11084. http://dx.doi.org/10.1103/PhysRevB.45.11067

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