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Miura, Y., Katsumi, Y., Tanaka, K., Oda, S., Habuka, H., Gao, Y., Fukai, Y., Fukae, K., Kato, T., Okumura, H. and Arai, K. (2008) Etching Rate Behavior of 4H-Silicon Carbide Using Chlorine Trifluoride Gas. ECS Transactions, 13, 39-52.
http://dx.doi.org/10.1149/1.2913079

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