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Zollner, S., Hildreth, J., Liu, R., Zaumseil, P., Weidner, M. and Tillack, B. (2000) Optical Constants and Ellipsometric Thickness Determination of Strained Si1-x Gex:C Layers on Si (100) and Related Heterostructures. Journal of Applied Physics, 88, 4102-4108. http://dx.doi.org/10.1063/1.1308070

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