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Jang, J.H., Phen, M.S., Siebin, K., Jones, K.S. and Craciun, V. (2009) Observation of Defects Evolution in Strained SiGe Layers during Strain Relaxation. Materials Letters, 263, 289-291. http://dx.doi.org/10.1016/j.matlet.2008.10.031

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