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Matin, M.A., Jezierski, A.F., Bashar, S.A., Lacklison, D.E., Benson, T.M., Cheng, T.S. and Rezazadeh, A.A. (1994) Electronics Letters, 30, 318-320.
http://dx.doi.org/10.1049/el:19940243

has been cited by the following article:

• TITLE: Effect of Heat Treatment on the Nanoscale Structure and Optical Properties of Cd2SnO4 Thin Films Deposited by RF Magnetron Sputtering

  AUTHORS: Ateyyah M. Al-Baradi

  KEYWORDS: Thin Films, Atomic Force Microscope, Transmittance, Reflectance, Optical Energy Gap, Optical Conductivity

  JOURNAL NAME: Journal of Modern Physics, Vol.6 No.13, October 21, 2015

  ABSTRACT: Cadmium tin oxide Cd2SnO4 thin films with a thickness of 228.5 nm were prepared by RF magnetron sputtering technique on glass substrates at room temperature. AFM has been utilized to study the morphology of these films as a function of annealing temperature at the nanoscale. The optical properties of these films, such as the transmittance, T(λ), and reflectance, R(λ), have been studied as a function of annealing temperature. The optical constants, such as optical energy gap, width of the band tails of the localized states, refractive index, oscillatory energy, dispersion energy, real and imaginary parts of both dielectric constant and optical conductivity have been found to be affected by changing the annealing temperature of the films.