Article citationsMore>>

Michlin, Y.H., Ingman, D. and Levin-David, L. (2012) Sequential Test for Reliability under Allowance for Target Uncertainty. IEEE Transactions on Reliability, 61, 1019-1029.
http://dx.doi.org/10.1109/TR.2012.2220911

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top