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W. Eitel, The Physical Chemistry of the Silicates (The University of Chicago Press, Chicago, 1954). (The Russian translation, Publishing House of Foreign Literature, Moscow, 1962. – 1055 p.).

has been cited by the following article:

• TITLE: Effect of Glass Composition on the Thermal Expansion of Relict Crystals of RuO2 in Doped Lead-Silicate Glasses (Thick Film Resistors)

  AUTHORS: Gulmurza Abdurakhmanov

  KEYWORDS: Ruthenium Dioxide, Anomalous Thermal Expansion, High Temperature X-Ray Diffraction, Anomalies of Resistivity and Thermopowe

  JOURNAL NAME: Journal of Modern Physics, Vol.2 No.7, July 7, 2011

  ABSTRACT: The thermal expansion coefficients (TEC) of RuO2 crystallits in thick film resistor (TFR) composites, consisting of RuO2 dispersed in lead-silicate glass of various compositions, were evaluated from X-ray diffraction patterns at temperatures 298; 773; 973 and 1123 K corresponding to characteristic temperatures of resistivity and thermopower anomalies of the TFRs. It has been found that TEC of free RuO2 powder along a-axis has an anomaly at T > 973 K (expansion is replaced by constriction), whereas constriction along c-axes remains for all temperatures. This anomaly disappears in doped glass of simplest composition (2SiO2.PbO) but occurs in glasses of some complex compositions. Symmetry of unit cell of RuO2 is not changed in the temperature range investigated.