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B. X. Shi, C. W. Ong and K. L. Tam, “Measurements of Thermal Diffusivity of Boron-Silicon Film-on-Glass Structure Using Phase Detection Method of Photothermal Deflection Spectroscopy,” Journal of Materials Science, Vol. 34, No. 21, 1999, pp. 5169-5173. doi:10.1023/A:1004751627438

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