Article citationsMore>>

Panwar, O.S., Khan, M.A., Kumar, S., Basu, A., Mehta, B.R. and Kumar, S. (2010) Effect of High Substrate Bias and Hydrogen and Nitrogen Incorporation of Spectroscopic Ellipsometric and Atomic Force Microscopic Studies of Tetrahedral Amorphous Carbon Films. Surface and Coatings Technology, 205, 2126-2133.
http://dx.doi.org/10.1016/j.surfcoat.2010.08.119

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top