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Frazer, B.H., Gilbert, B., Sonderegger, B.R. and Stasio, G.D. (2003) The Probing Depth of Total Electron Yield in the Sub-KeV Range: TEY-XAS and X-PEEM. Surface Science, 537, 161-167.
http://dx.doi.org/10.1016/S0039-6028(03)00613-7

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