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Uno, Y., Prasher, S.O., Lacroix, R., Goel, P.K., Karimi, Y., Viau, A. and Patel, R.M. (2005) Artificial Neural Networks to Predict Corn Yield from Compact Airborne Spectrographic Imager Data. Computers and Electronics in Agriculture, 47, 149-161.
http://dx.doi.org/10.1016/j.compag.2004.11.014

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