Article citationsMore>>

Su, Z.Q. and Ye, L. (2004) An Intelligent Signal Processing and Pattern Recognition Technique for Defect Identification Using an Active Sensor Network. Smart Materials and Structures, 13, 957-969.
http://dx.doi.org/10.1088/0964-1726/13/4/034

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top