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Oshima, N., Nakajyo, T., Kanazawa, I., Iwashita, T., Ito, Y., Soe, W. and Yamamoto, R. (1995) Multilayered Ni/Hf and Solid-State Amorphization Studied Using the Slow Positron Beam Technique. Appl. Surf. Sci., 85, 329. http://dx.doi.org/10.1016/0169-4332(94)00354-8

has been cited by the following article:

• TITLE: Solid-State Reaction and Vacancy-Type Defects in Bilayer Fe/Hf Studied by the Slow Positron Beam

  AUTHORS: K. Yamada, T. Sasaki, T. Nagata, I. Kanazawa, R. Suzuki, T. Ohdaira, K. Nozawa, F. Komori

  KEYWORDS: Metallic Films, Positron Annihilation Measurement, Solid-State Reaction, Fe Film, Diffusion, Vacancy-Type Defects

  JOURNAL NAME: Journal of Applied Mathematics and Physics, Vol.3 No.2, January 30, 2015

  ABSTRACT: The positron annihilation lifetimes and the Doppler broadening by slow positron beam are measured in thin Fe films with thickness 500 nm, a thin Hf film with thickness 100 nm, and the bilayer Fe (50 nm)/Hf (50 nm) on quartz glass substrate. We have analyzed the behavior in vacancy-type defects in each layer through some deposition temperatures and annealing. It is observed that the thin Fe film, the thin Hf film, and the bilayer Fe (50 nm)/Hf (50 nm) already contain many vacancy-type defects. We have investigated the change of densities of the vacancy-carbon complex and the small vacancy-cluster with carbons, through solid-state amorphization of Fe (50 nm)/Hf (50 nm) bilayer.