Article citationsMore>>

Lee, P.S. (2002) Enhanced Stability of Ni Monosilicide on MOSFETs Poly-Si Gate Stack. Microelectronic Engineering, 60, 171-181.
http://dx.doi.org/10.1016/S0167-9317(01)00592-5

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top