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Alsem, D.H., Pierron, O.N., Stach, E.A., Muhlstein, C.L. and Ritchie, R.O. (2007) Mechanisms for Fatigue of Micron-Scale Silicon Structural Films. Advanced Engineering Materials, 9, 15-30.
http://dx.doi.org/10.1002/adem.200600269

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