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Yan, J., Sakai, S., Isogai, H. and Izunome, K. (2009) Recovery of Microstructure and Surface Topography of Grinding- Damaged Silicon Wafers by Nanosecond-Pulsed Laser Irradiation. Semiconductor Science and Technology, 24, Article ID: 105018.
http://dx.doi.org/10.1088/0268-1242/24/10/105018

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