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Pierron, O.N. and Muhlstein, C.L. (2006) The Critical Role of Environment in Fatigue Damage Accumulation in Deep-Reactive Ion-Etched Single-Crystal Silicon Structural Films. Journal of Microelectromechanical Systems, 15, 111-119.
http://dx.doi.org/10.1109/JMEMS.2005.863602

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