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Ma, B., Cho, S., Lee, C., Lee, S., Kang, J., Kim, B., Kang, D., Shin, Y., Kim, Y., Kim, T. and Park, Y. (1974) Japanese Journal of Applied Physics, 45, 774-777.
http://dx.doi.org/10.1143/JJAP.45.774

has been cited by the following article:

• TITLE: Deep Level Transient Spectroscopy of AlGaInP LEDs

  AUTHORS: M. Atiq, Nazir A. Naz, Akbar Ali

  KEYWORDS: Semiconductors, MOCVD, Defects, DLTS

  JOURNAL NAME: Journal of Modern Physics, Vol.5 No.18, December 25, 2014

  ABSTRACT: Deep level transient spectroscopy (temperature scans) of AlGaInP based red light emitting diodes was carried out from 77 K to room temperature. At least ten defects were observed. Of these, five defects assigned to energy states 0.21, 0.22, 0.24, 0.26, and 0.24 eV were characterized. Respective capture cross-sections, measured at infinite temperature (T = ∞), QUOTE were found to be 8.84 × 10-16, 6.98 × 10-16, 7.86 × 10-16, 9.9 × 10-16 and 2.1 × 10-16 cm2. Corresponding concentrations of defects were 3.7 × 1013, 3.5 × 1013, 3.2 × 1013, 3.3 × 1013 and 3.1 × 1013 cm-3.