Article citationsMore>>

Boubaker, A., Sghaier, N., Souifi, A. and Kalboussi, A. (2010) Simulation and Modeling of the Write/Erase Kinetics and the Retention Time of Single Electron Memory at Room Temperature. Journal of Semiconductor Technology and Science, 10, 143-151.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top