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J.F. Rommeluere, L. Svob, F. Jomard, J. Mimila-Arroyo, A. Lusson, V. Sallet and Y. Marfaing, “Electrical activity of nitrogen acceptors in ZnO films grown by metalorganic vapor phase epitaxy”, Appl. Phys. Lett. Vol. 83, 2003, pp. 287.

has been cited by the following article:

• TITLE: Growth Mechanism of Zno Films Deposited by Spray Pyrolysis Technique

  AUTHORS: Bhavana Godbole, Nitu Badera, Shyambihari Shrivastava, Deepti Jain, Vganesan Ganesan

  KEYWORDS: Nano-Crystalline Materials, Thin Film, Atomic Force Microscope, Structure and Morphology, Thickness

  JOURNAL NAME: Materials Sciences and Applications, Vol.2 No.6, June 24, 2011

  ABSTRACT: Transparent Zinc Oxide (ZnO) thin films having different thickness are prepared by using spray pyrolysis technique. Structural and morphological behavior has been studied by using atomic force microscopy and x-ray diffraction. The scaling behavior obtained by using height-height correlation method shows that, films with different thickness are developed under non-equilibrium condition behaves as self-affine surfaces. With the increase in thickness, the grain size as well as activation energy have found to be decreased.